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Cena: 30.00 zł
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Investigation of the Surface Resistance of Superconducting Materials

J.-P. Koutchouk (red. nauk.)
R.S. Romaniuk (red. nauk.)
Wydawnictwo: OWPW

Vol. XV, Editorial Series on Accelerator Science (R.S. Romaniuk, J.-P. Koutchouk - Editors) 
 
For more information see page eucard-old.web.cern.ch/eucard-old/activities/communication/booklets/
 

Słowa kluczowe: materiały nadprzewodzące, technika akceleratorowa, jakość powierzchni nadprzewodników, rezystancja powierzchniowe nadprzewodników, akceleratory nadprzewodzące, straty residualne w nadprzewodniku
 
Keywords: superconducting materials, accelerator technology, quality of superconductor surface, surface resistance of superconductors, superconducting accelerators, residual losses in superconductors
 
Abstract:

In particle accelerators superconducting RF cavities are widely used to achieve high accelerating gradients and low losses. Power consumption is proportional to the surface resistance RS which depends on a number of external parameters, including frequency, temperature, magnetic and electric field. Presently, there is no widely accepted model describing the increase of Rs with applied field.
 

In the frame of this project the 400MHz Quadrupole Resonator has been extended to 800 and 1200MHz to study surface resistance and intrinsic critical RF magnetic field of superconducting samples over a wide parameter range, establishing it as a world-wide unique test facility for superconducting materials.

Different samples were studied and it was shown that RS is mainly caused by the RF electric field in the case of strongly oxidized surfaces. This can be explained by interface tunnel exchange of electrons between the superconductor and localized states in adjacent oxides. For well prepared surfaces, however, the majority of the dissipation is caused by the magnetic field and RS factorizes into field and temperature dependent parts.
 

These different loss mechanisms were correlated to surface topography of the samples and distribution of oxides by using ultrasonic force microscopy and X-ray photon spectroscopy.

Rok: 2012
Stron: 144
ISBN: 978-83-7814-056-6
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